Weifang Academy of Advanced Opto-Electronic Circuits Infrared Intelligent Sensing and Chip Detection Technology R&D Center
本研发中心由褚君浩院士领衔建立。研究采用高分辨率室温红外图像采集分析系统，结合主动红外辐照光源系统，实现在线热缺陷检测，有效提高器件缺陷检出率，提升芯片热稳定性。
The R&D center was led by Academician Chu Junhao. The research uses high-resolution room temperature infrared image acquisition and analysis system, combined with active infrared radiation source system to realize on-line thermal defect detection, effectively improve the detection rate of device defects and improve the thermal stability of the chip.